This inventor holds 2 USPTO granted patents. Top assignees: Ahbee 1, L.p., Other. Active years: 2006-2009.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
1 out of 10 
1 out of 834,453 Years Active: 2006-2009
Title: Wojciech Walecki: Innovator in Optical Metrology
Introduction
Wojciech Walecki is a notable inventor based in San Jose, California. He has made significant contributions to the field of optical metrology, holding two patents that showcase his innovative spirit and technical expertise.
Latest Patents
Walecki's latest patents include a device for measuring absolute distances using low coherence optical interferometry. This invention addresses the thermal issues commonly faced by conventional fiber optic interferometers, which are affected by temperature variations that alter the refractive index of the optical fiber material. His second patent involves a method and apparatus for determining the thickness of slabs of materials using an interferometer, further demonstrating his commitment to advancing measurement technologies.
Career Highlights
Throughout his career, Walecki has worked with various companies, including Ahbee 1, L.P. His work has significantly impacted the development of optical measurement techniques, making him a respected figure in his field.
Collaborations
Walecki has collaborated with Phuc Van, contributing to the advancement of optical metrology through shared knowledge and expertise.
Conclusion
Wojciech Walecki's innovative contributions to optical metrology highlight his role as a leading inventor in the field. His patents reflect a dedication to solving complex measurement challenges, making a lasting impact on technology.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile