Company Filing History:
Years Active: 1999-2006
Title: Wlodzimierz Woytek Tworzydlo: Innovator in ESD Protection Technologies
Introduction
Wlodzimierz Woytek Tworzydlo is a notable inventor based in Austin, TX (US). He has made significant contributions to the field of electrostatic discharge (ESD) protection technologies. With a total of 3 patents, his work focuses on preventing thermo-mechanical damage in microcircuits during ESD events.
Latest Patents
Tworzydlo's latest patents include innovative methods and apparatuses designed to enhance the reliability of ESD protection devices. One of his patents, titled "Method and apparatus for preventing microcircuit thermo-mechanical damage during an ESD event," discloses a technique that utilizes materials with superior thermo-mechanical properties. This invention aims to prevent damage caused by localized heating and thermal expansion in ESD devices. Another patent, "Method and apparatus for preventing microcircuit dynamic thermo-mechanical damage during an ESD event," focuses on mitigating failures in ESD protection circuits due to elastic waves generated by rapid ESD discharge events. This patent emphasizes the use of materials with exceptional damping and mechanical properties to safeguard integrated circuits.
Career Highlights
Throughout his career, Wlodzimierz has worked with various companies, including Esd Pulse, Inc. His expertise in ESD protection technologies has positioned him as a valuable contributor to advancements in this critical area of electronics.
Collaborations
Wlodzimierz has collaborated with professionals in the field, including his coworker Vladimir Rodov. Their joint efforts have furthered the development of innovative solutions for ESD protection.
Conclusion
Wlodzimierz Woytek Tworzydlo's contributions to ESD protection technologies highlight his innovative spirit and dedication to enhancing the reliability of electronic devices. His patents reflect a deep understanding of thermo-mechanical properties and their application in preventing damage during ESD events.