Company Filing History:
1 out of 42 
1 out of 16,338 
Years Active: 1995-1997
Title: The Innovations of William Jeffrey Allard
Introduction
William Jeffrey Allard is an accomplished inventor based in Elkton, MD (US). He holds two patents that showcase his expertise in assay technology. His work has contributed significantly to advancements in photometric detection methods.
Latest Patents
Allard's latest patents include an innovative assay with signal detection in the presence of a suspended solid support. This assay is designed for photometrically detecting and quantitating the presence of an analyte in a sample. The signal generated by a label associated with the analyte is photometrically detected, even in the presence of a suspended solid support. This technology has the potential to enhance the accuracy and efficiency of various analytical processes.
Career Highlights
Throughout his career, Allard has worked with notable companies such as Dade International Inc. and E.I. DuPont de Nemours and Company. His experience in these organizations has allowed him to refine his skills and contribute to significant projects in the field of assay development.
Collaborations
Some of Allard's coworkers include David M. Obzansky and Hemant Chunilal Vaidya. Their collaboration has likely fostered a productive environment for innovation and development in their respective fields.
Conclusion
William Jeffrey Allard's contributions to assay technology and his professional journey reflect his dedication to innovation. His patents and career achievements highlight the impact of his work in the scientific community.