William B Stanton

Title: The Innovative Contributions of William B. Stanton

Introduction

William B. Stanton is a notable inventor based in Tonawanda, NY (US). He has made significant contributions to the field of measurement technology, particularly in the area of coating thickness measurement. His innovative approach has paved the way for advancements in manufacturing processes.

Latest Patents

Stanton holds a patent for a "Method and apparatus for measuring coating thicknesses on continuously moving strip material." This invention utilizes radiation techniques to measure coating thicknesses without altering the path of the material. The method involves a shuttle that carries a measuring probe with a radioactive isotope source and a detection device. This shuttle is designed to engage with the strip material for synchronous movement during measurement cycles, ensuring accuracy and efficiency.

Career Highlights

William B. Stanton is associated with Twin City International, Inc., where he has applied his expertise in measurement technology. His work has contributed to the development of more precise manufacturing techniques, enhancing product quality and consistency.

Collaborations

Stanton has collaborated with notable coworkers, including James A. Holler and Jerry J. Spong. Their combined efforts have fostered innovation and progress within their field.

Conclusion

William B. Stanton's contributions to measurement technology exemplify the impact of innovative thinking in manufacturing. His patent and work at Twin City International, Inc. highlight the importance of precision in industrial processes.