Company Filing History:
Years Active: 2008-2010
Title: William A. Ciarfella: Innovator in Thermal Performance Assessment
Introduction
William A. Ciarfella is a notable inventor based in Round Rock, TX (US). He has made significant contributions to the field of thermal performance assessment, holding 2 patents that reflect his innovative approach to technology.
Latest Patents
Ciarfella's latest patents focus on systems and arrangements to assess thermal performance. These systems are designed to evaluate the ability of a device under test (DUT) to operate according to electrical performance criteria. The embodiments of his inventions include a tester that couples with the DUT to determine its operating junction temperature. In some cases, the measured junction temperature represents the anticipated operating junction temperature for the DUT in a customer installation. Additionally, the tester may incorporate logic to calculate a projected operating junction temperature based on the measured junction temperature and known differences between the tester and a customer installation. Once the operating junction temperature is determined, it is compared against a maximum junction temperature to ensure proper operation of the DUT. Notably, the maximum junction temperature can be adjusted based on the project objectives for a line of DUTs.
Career Highlights
William A. Ciarfella is associated with the International Business Machines Corporation (IBM), where he has contributed to various projects and innovations. His work has been instrumental in advancing thermal performance assessment technologies.
Collaborations
Ciarfella has collaborated with notable coworkers, including Ronald Xavier Arroyo and Kenneth A. Bird. Their combined expertise has further enhanced the development of innovative solutions in their field.
Conclusion
William A. Ciarfella's contributions to thermal performance assessment demonstrate his commitment to innovation and excellence in technology. His patents and collaborations reflect a dedication to improving device performance in real-world applications.