William A Arno

Title: William A. Arno: Innovator in Thickness Measurement Technology

Introduction

William A. Arno is a notable inventor based in Binghamton, NY (US). He has made significant contributions to the field of thickness measurement technology, holding a total of 2 patents. His work primarily focuses on improving systems used in mail handling processes.

Latest Patents

Arno's latest patents include a thickness measuring system that features improved software for use within a mail handling system. This innovative device is designed to measure the thickness dimension of articles being conveyed along a conveyor system. It comprises a rotary encoder and a lever arm that is pivotally mounted on the shaft of the rotary encoder. The lever arm is positioned to contact the article conveyor, allowing it to be deflected by the articles being conveyed. The deflection causes the rotary shaft of the encoder to rotate a predetermined amount, which indicates the thickness of the article. The system is also linked to a storage bin, which halts the conveyance of articles once a predetermined cumulative thickness dimension is detected. This technology is particularly effective for accurately measuring articles with both constant and variable thickness dimensions.

Career Highlights

William A. Arno is currently employed at Lockheed Martin Corporation, where he continues to develop innovative solutions in his field. His expertise in thickness measurement systems has positioned him as a valuable asset to the company.

Collaborations

Arno collaborates with Edward S. Engarto, contributing to advancements in their shared field of expertise.

Conclusion

William A. Arno's contributions to thickness measurement technology demonstrate his commitment to innovation and improvement in mail handling systems. His patents reflect a deep understanding of the complexities involved in measuring article dimensions accurately.