Company Filing History:
Years Active: 2015
Title: Willem G J Langevel: Innovator in X-ray Spectroscopy
Introduction
Willem G J Langevel is a notable inventor based in Menlo Park, CA (US). He has made significant contributions to the field of X-ray spectroscopy, particularly in the development of systems that enhance material composition analysis.
Latest Patents
Langevel holds a patent for a "High-energy X-ray-spectroscopy-based inspection system and methods to determine the atomic number of materials." This innovative application discloses systems and methods for X-ray scanning that identify the material composition of an object being scanned. The system includes at least one X-ray source that projects an X-ray beam onto the object, with a portion of the beam transmitted through it. An array of detectors measures the energy spectra of the transmitted X-rays, which are then used to determine the atomic number of the object. This technology is crucial for accurately identifying material composition.
Career Highlights
Langevel is currently associated with Rapiscan Systems, Inc., where he continues to advance his research and development efforts. His work has led to the creation of sophisticated inspection systems that are vital in various industries, including security and materials science.
Collaborations
Some of his notable coworkers include Tsahi Gozani and Joseph Bendahan, who have collaborated with him on various projects within the field of X-ray technology.
Conclusion
Willem G J Langevel's contributions to X-ray spectroscopy and material analysis have established him as a key figure in the field. His innovative patent reflects his commitment to advancing technology that enhances our understanding of material composition.