Wenhai Han

Title: The Innovations of Wenhai Han

Introduction

Wenhai Han is a notable inventor based in Tempe, Arizona, recognized for his contributions to the field of atomic force microscopy. With a total of four patents to his name, Han has made significant advancements in the technology that enhances the capabilities of scanning probe microscopes.

Latest Patents

One of his latest patents is titled "Magnetic modulation of force sensor for AC detection in an atomic force." This invention provides a scanning probe microscope that generates a signal corresponding to the surface characteristics of a scanned sample. It features a force sensing probe tip on a flexible cantilever, a magnetized material, an XY scanner for relative movement, a Z control for distance adjustment, and a deflection detector for generating a deflection signal. The microscope also includes an AC signal source and a magnetic field generator that modulates the magnetic field with the AC signal. Another significant patent is for a "Microscope for compliance measurement," which includes a force sensing probe tip, a scanning element for movement, a device for generating a magnetic field, and a driver that utilizes alternating current and a controlled magnitude current to detect the position of the probe tip.

Career Highlights

Wenhai Han has worked with several organizations, including Molecular Imaging Corporation and the Arizona Board of Regents. His work has focused on enhancing the functionality and precision of atomic force microscopes, contributing to advancements in various scientific fields.

Collaborations

Throughout his career, Han has collaborated with notable individuals such as Stuart Lindsay and Tianwei Jing, further enriching his research and innovations.

Conclusion

Wenhai Han's contributions to atomic force microscopy through his patents and collaborations have significantly impacted the field. His innovative approaches continue to pave the way for advancements in scientific research and technology.