Wen-Yu Shih

Title: Innovations of Wen-Yu Shih in Optical Measurement Systems.

Introduction: Wen-Yu Shih is an accomplished inventor based in Nantou County, Taiwan. He has made significant contributions to the field of optical measurement systems. His innovative work focuses on measuring optical parameters of objects with complex light-transmitting layers.

Latest Patents: Wen-Yu Shih holds a patent for an optical measurement system. This system is designed to measure optical parameters of an object that includes at least two light-transmitting layers. The optical measurement system comprises a light source module, an image capture module, and a controller. The light source module emits at least two measurement light beams toward the object, which are incident at different angles. The image capture module receives light spots formed on its sensing surface by the reflected and refracted measurement light beams. The controller calculates the optical parameters of the object based on the positions of these light spots.

Career Highlights: Wen-Yu Shih is affiliated with National Cheng Kung University, where he continues to advance research in optical technologies. His work has garnered attention for its practical applications in various fields.

Collaborations: One of his notable collaborators is Chien-Sheng Liu, who contributes to the research and development of optical measurement systems.

Conclusion: Wen-Yu Shih's innovative contributions to optical measurement systems highlight the importance of advancements in technology. His work not only enhances our understanding of optical parameters but also paves the way for future innovations in the field.