Company Filing History:
Years Active: 2015-2017
Title: Weichao Du: Innovator in Nanoscale Measurement Technologies
Introduction
Weichao Du is a prominent inventor based in Wuhan, China. He has made significant contributions to the field of nanoscale measurement technologies. With a total of 2 patents, his work focuses on innovative methods and devices that enhance measurement accuracy at the nanoscale level.
Latest Patents
Du's latest patents include a "Method and device for measuring large-area and massive scattered field in nanoscale." This device is designed to measure large-area and massive scattered fields at the nanoscale. It incorporates a polarization state generator, a polarization state analyzer, a first objective lens, and a scanning mirror, all working together to achieve precise measurements. Another notable patent is the "Alignment method for optical axes of composite waveplate." This method involves rotating a waveplate and adjusting its angle to minimize discrepancies between the spectral parameters of the composite waveplate and ideal values.
Career Highlights
Weichao Du is affiliated with Huazhong University of Science and Technology, where he continues to advance research in his field. His innovative approaches have garnered attention and respect within the scientific community.
Collaborations
Du has collaborated with notable colleagues such as Shiyuan Liu and Chuanwei Zhang, contributing to various research projects and enhancing the scope of their work.
Conclusion
Weichao Du's contributions to nanoscale measurement technologies exemplify the impact of innovative thinking in scientific research. His patents reflect a commitment to advancing measurement techniques, which can lead to significant advancements in various applications.