Taipei, Taiwan

Wei Lan William Chiu

USPTO Granted Patents = 2 

 

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2015

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2 patents (USPTO):Explore Patents

Title: Wei Lan William Chiu: Innovator in Chemical Mechanical Polishing

Introduction

Wei Lan William Chiu is a notable inventor based in Taipei, Taiwan. He has made significant contributions to the field of chemical mechanical polishing (CMP) through his innovative patents. With a total of 2 patents, Chiu has established himself as a key figure in the development of advanced polishing compositions.

Latest Patents

Chiu's latest patents include an aqueous polishing composition and process for chemically mechanically polishing substrates with low-k dielectric layers. This invention features an aqueous polishing composition that comprises abrasive particles and an amphiphilic nonionic surfactant. The surfactant is selected from a group of water-soluble or water-dispersible surfactants with specific hydrophobic and hydrophilic groups. Additionally, he has developed a CMP composition that includes a non-ionic surfactant and a carbonate salt, further enhancing the efficiency of the polishing process.

Career Highlights

Chiu is currently associated with BASF SE Corporation, where he continues to innovate in the field of CMP. His work focuses on improving the manufacturing processes for electrical, mechanical, and optical devices. His contributions have been instrumental in advancing the technology used in the semiconductor industry.

Collaborations

Chiu has collaborated with notable colleagues, including Yuzhuo Li and Robert Reichardt. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.

Conclusion

Wei Lan William Chiu is a prominent inventor whose work in chemical mechanical polishing has made a significant impact on the industry. His innovative patents and collaborations highlight his commitment to advancing technology in this field.

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