Company Filing History:
Years Active: 1992-2002
Title: Wayne I Knigge: Innovator in X-ray Detection Technology
Introduction
Wayne I Knigge is a notable inventor based in Maple Grove, MN (US). He has made significant contributions to the field of manufacturing and packaging technology. With a total of 4 patents, his work focuses on enhancing the detection of components in sealed packages using advanced x-ray technology.
Latest Patents
Wayne's latest patents include innovative methods for detecting variable manufacturing tolerance packages. One of his patents describes a system for detecting missing components from sealed packages. This is achieved by combining multiple electrical outputs that represent the mass in volumes of the package. The combined value is then compared to a standard value for packages that include all components. In the preferred embodiment, the mass is represented by the absorption of x-rays. The packages are conveyed on a conveyor between an x-ray radiator generating a fan-shaped x-ray beam and a line array of individual detectors. These detectors detect radiation after it passes through the package and provide a numerical electrical signal equal to the amount of radiation detected. If the sum of these signals is less than the standard value, the package is rejected from the conveyor by a rejection device.
Another patent focuses on the detection of variable positionable missing components utilizing x-rays. Similar to the previous patent, this method combines electrical outputs representing the mass in volumes of the package and compares it to a standard value. The process involves the same x-ray technology and detection methods, ensuring that any missing components are identified effectively.
Career Highlights
Wayne I Knigge is currently employed at General Mills, Inc., where he applies his expertise in x-ray detection technology. His work has contributed to improving the quality control processes within the manufacturing sector.
Collaborations
Throughout his career, Wayne has collaborated with notable colleagues, including Brian A Piotrowski and Valerian H Wessel. These collaborations have further enhanced the development of innovative solutions in the field.
Conclusion
Wayne I Knigge's contributions to x-ray detection technology have made a significant impact on the manufacturing industry. His innovative patents demonstrate his commitment to improving quality control and ensuring the integrity of packaged products.