San Jose, CA, United States of America

Wayne Eric Burk

USPTO Granted Patents = 6 

Average Co-Inventor Count = 3.4

ph-index = 3

Forward Citations = 76(Granted Patents)


Company Filing History:


Years Active: 2002-2024

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6 patents (USPTO):

Title: Wayne Eric Burk: Pioneering Innovation in Technology

Introduction: Wayne Eric Burk, a visionary inventor based in San Jose, CA, has been a driving force in the world of inventions, dedicated to shaping a better future through technological advancements.

Latest Patents:

1. Multiple scan line sample filtering: Wayne's system and method for generating pixels for display devices revolutionizes efficiency by minimizing sample buffer accesses and enhancing performance through the utilization of common samples shared by neighboring pixels.

2. System and method for performing predictable signature analysis: Through this invention, Wayne ensures predictability in data output by replacing unpredictable values with predictable ones, enabling accurate signature analysis.

Career Highlights: With a remarkable portfolio of 5 patents, Wayne has established himself as a leader in the field of technology. His contributions have significantly impacted the development of display systems and data analysis processes.

Collaborations: Throughout his career, Wayne has collaborated with industry giants such as Sun Microsystems, Inc. His successful partnerships with colleagues like Yan Yan Tang and Philip C Leung have led to groundbreaking innovations in the tech industry.

Conclusion: Wayne Eric Burk's relentless dedication to innovation and his passion for creating cutting-edge solutions have cemented his position as a prominent figure in the world of inventions. His pioneering work continues to inspire and shape the future of technology.

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