Upper Marlboro, MD, United States of America

Warren T Beard, Jr


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 1990

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1 patent (USPTO):Explore Patents

Title: The Innovations of Warren T Beard, Jr.

Introduction

Warren T Beard, Jr. is a notable inventor based in Upper Marlboro, MD (US). He has made significant contributions to the field of x-ray imaging systems, particularly through his innovative patent. His work has implications for both scientific research and practical applications in various industries.

Latest Patents

Warren T Beard, Jr. holds a patent for a "Method and apparatus for line-modified asymmetric crystal topography." This invention features an improved asymmetric crystal topography x-ray imaging system that employs a line focus horizontal line source of x-rays and a crystal monochromator used in a compression mode. The design allows for relatively large horizontal and vertical dimensions of the monochromating crystal, enabling the imaging of larger areas of imperfect crystals than previously possible, without adversely affecting image resolution. The high-resolution two-dimensional images produced are a direct consequence of the method of controlling the probe beam divergences. Additionally, an appreciably enhanced and useful intensity of monochromatic x-rays is obtained over that available with prior asymmetric crystal topography systems.

Career Highlights

Warren T Beard, Jr. is associated with the U.S. Government as represented by the Director of the National Security Agency. His work in this capacity has allowed him to contribute to advancements in technology that support national security and scientific exploration.

Collaborations

Warren has collaborated with Ronald W Armstrong, further enhancing the innovative efforts in their field. Their partnership exemplifies the importance of teamwork in achieving groundbreaking advancements.

Conclusion

Warren T Beard, Jr. is a distinguished inventor whose work in x-ray imaging systems has paved the way for improved methodologies in the analysis of imperfect crystals. His contributions continue to influence both research and practical applications in various sectors.

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