Walter Breunig

Title: Walter Breunig: Innovator in Opto-Electronic Inspection

Introduction

Walter Breunig is a notable inventor based in Karlsruhe, Germany. He has made significant contributions to the field of opto-electronic inspection, particularly in the inspection of two-dimensional patterns on objects such as printed circuit boards. His innovative methods have paved the way for advancements in automated inspection technologies.

Latest Patents

Walter Breunig holds a patent for a "Method of and system for opto-electronic inspection of a two-dimensional pattern on an object." This patent describes a process where a micro-inspection is conducted by scanning picture elements line-by-line and performing a series of picture operations to inspect dimensions and spacings. The results are compared with the corresponding scanned pixels. Simultaneously, a macro-inspection is performed by combining scanned pixels into frames, which are then reduced to a single characteristic picture for comparison with a reference image. This dual approach allows for quick and fully automatic real-time inspection of two-dimensional patterns, effectively identifying both minute defects and larger macro-defects.

Career Highlights

Walter Breunig is associated with Dr. Ludwig Pietzsch GmbH, where he has applied his expertise in opto-electronic inspection. His work has been instrumental in enhancing the efficiency and accuracy of inspection processes in various applications.

Collaborations

Throughout his career, Walter has collaborated with notable colleagues, including Ludwig Pietzsch and Knud Overlach. These partnerships have contributed to the development and refinement of innovative inspection technologies.

Conclusion

Walter Breunig's contributions to the field of opto-electronic inspection demonstrate his commitment to innovation and excellence. His patented methods have significantly advanced the capabilities of automated inspection systems, ensuring higher quality standards in manufacturing processes.