Company Filing History:
Years Active: 2009
Title: Wafaa Abdalla: Innovator in Surface Inspection Technologies
Introduction
Wafaa Abdalla is a notable inventor based in San Jose, California. She has made significant contributions to the field of surface inspection technologies, holding two patents that showcase her innovative approach to detecting defects on disk surfaces. Her work is instrumental in enhancing the quality control processes in various industries.
Latest Patents
Wafaa Abdalla's latest patents include "Surface inspection by amplitude modulated specular light detection" and "Surface inspection by double pass laser doppler vibrometry." The first patent describes an apparatus that utilizes a light source to generate a light beam, which is then split into two portions. This setup allows for the detection of defects on a disk surface by analyzing the reflected light beam. The second patent outlines a double pass apparatus that modulates a light beam to illuminate the disk surface, effectively doubling the frequency shift of the reflected light beam for improved defect detection.
Career Highlights
Wafaa Abdalla is currently employed at Seagate Technology Incorporated, where she applies her expertise in optical technologies to develop advanced inspection systems. Her work has significantly contributed to the company's reputation for quality and innovation in data storage solutions.
Collaborations
Wafaa collaborates with her coworker, Peter C. Jann, to further enhance the capabilities of their technologies. Together, they work on projects that push the boundaries of surface inspection methods.
Conclusion
Wafaa Abdalla's contributions to surface inspection technologies through her patents and work at Seagate Technology Incorporated highlight her role as an influential inventor in her field. Her innovative approaches continue to drive advancements in quality control processes.