Company Filing History:
Years Active: 1983
Title: Victor J Sank: Innovator in Gamma Ray Coincidence Analysis
Introduction
Victor J Sank is a notable inventor based in Wheaton, MD (US). He has made significant contributions to the field of nuclear imaging technology. His innovative work has led to the development of a unique gamma ray coincidence analysis system.
Latest Patents
Victor J Sank holds a patent for a gamma ray coincidence analysis system. This system is designed for multichannel nuclear imaging devices that utilize scintillation detectors arranged in ring-like arrays. The patent details a sophisticated mechanism where timing and energy discriminators work in conjunction to validate energy levels and generate data output signals based on the concurrence of delayed signals.
Career Highlights
Victor J Sank is associated with the United States of America as Represented by the Department of Health. His work in this capacity has allowed him to focus on advancing nuclear imaging technologies. His patent reflects his expertise and commitment to improving medical imaging techniques.
Collaborations
Victor has collaborated with notable colleagues such as Walter S Friauf and Rodney A Brooks. These collaborations have likely contributed to the innovative advancements in his field.
Conclusion
Victor J Sank's contributions to gamma ray coincidence analysis exemplify the impact of innovation in medical imaging technology. His work continues to influence advancements in the field.