Berkeley, CA, United States of America

Vic B Kley

This inventor holds 6 USPTO granted patents. Top assignees: General Nanotechnology LLC, General Neontechnology, LLC. Active years: 2000-2003.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Vic B Kley. Retrieved from https://idiyas.com/inventor/vic-b-kley

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 6

Forward Citations = 218(Granted Patents)


Company Filing History:


Years Active: 2000-2003

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6 patents (USPTO):Explore Patents

Title: Vic B Kley: Innovator in Scanning Probe Microscopy

Introduction

Vic B Kley is a notable inventor based in Berkeley, CA (US). He has made significant contributions to the field of microscopy, particularly through his innovative designs and methods. With a total of 6 patents to his name, Kley's work has advanced the capabilities of scientific measurement techniques.

Latest Patents

Kley's latest patents include a scanning probe microscope assembly and a method for making confocal, spectrophotometric, near-field, and scanning probe measurements. This invention allows for the formation of associated images from these measurements, enhancing the precision and utility of microscopy in various applications.

Career Highlights

Throughout his career, Vic B Kley has worked with General Nanotechnology LLC, where he has applied his expertise in nanotechnology and microscopy. His work has been instrumental in developing advanced measurement techniques that are crucial for research and industrial applications.

Collaborations

Due to space constraints, the details of collaborations will not be included.

Conclusion

Vic B Kley's contributions to the field of scanning probe microscopy exemplify his innovative spirit and dedication to advancing scientific measurement techniques. His patents continue to influence the industry and inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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