Singapore, Singapore

Venugopal Srinivasan

This inventor holds 1 USPTO granted patent. Top assignee: New York Institute of Technology. Active years: 1987.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Venugopal Srinivasan. Retrieved from https://idiyas.com/inventor/venugopal-srinivasan-zr7j0eeb

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 95(Granted Patents)


Company Filing History:


Years Active: 1987

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1 patent (USPTO):Explore Patents

Title: Venugopal Srinivasan: Innovator in Optical Profilometry

Introduction

Venugopal Srinivasan is a notable inventor based in Singapore, recognized for his contributions to the field of optical profilometry. He has developed innovative methods that enhance the measurement of surface profiles, which are crucial in various scientific and industrial applications.

Latest Patents

Srinivasan holds a patent for a "Method and apparatus for surface profilometry." This invention utilizes phase measurements of deformed grating images to perform improved optical profilometry. In one embodiment, phase differences between images of an object and a reference plane are employed to obtain a precise measure of the object's height. This advancement has significant implications for industries that rely on accurate surface measurements.

Career Highlights

Venugopal Srinivasan is affiliated with the New York Institute of Technology, where he continues to contribute to research and development in his field. His work has garnered attention for its innovative approach to solving complex measurement challenges.

Collaborations

Srinivasan collaborates with Maurice Halioua, a fellow researcher, to further explore advancements in optical technologies. Their partnership exemplifies the collaborative spirit that drives innovation in research institutions.

Conclusion

Venugopal Srinivasan's work in optical profilometry showcases his commitment to advancing measurement technologies. His patent reflects a significant step forward in the field, and his ongoing contributions at the New York Institute of Technology continue to inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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