Nijmegen, Netherlands

Venkat R Nagaswami


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2001

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Venkat R Nagaswami: Innovator in Integrated Circuit Manufacturing

Introduction

Venkat R Nagaswami is a notable inventor based in Nijmegen, Netherlands. He has made significant contributions to the field of semiconductor manufacturing, particularly in the detection and classification of defects in integrated circuits. His innovative approach has the potential to enhance the efficiency and reliability of semiconductor production.

Latest Patents

Venkat R Nagaswami holds a patent for a method of manufacturing integrated circuits. This patent focuses on detecting visible defects on a process semiconductor wafer. The method involves classifying defects according to their appearance and maintaining an association between classes and apparatuses. When the density of defects in a specific class exceeds a control limit, the associated apparatus is switched off-line. The process includes repeated inspections of the same wafer after different processing steps, allowing for the elimination of previously detected defects from the density comparison against the control limit. This innovative approach aims to improve the quality control in semiconductor manufacturing.

Career Highlights

Venkat R Nagaswami is currently employed at U.S. Philips Corporation, where he continues to work on advancements in semiconductor technology. His expertise in integrated circuit manufacturing has positioned him as a valuable asset to the company and the industry at large.

Collaborations

Throughout his career, Venkat has collaborated with several professionals in the field, including Johannes G Van Gessel and Dries A Van Wezep. These collaborations have contributed to the development of innovative solutions in semiconductor manufacturing.

Conclusion

Venkat R Nagaswami's contributions to the field of integrated circuit manufacturing demonstrate his commitment to innovation and quality. His patent for detecting and classifying defects in semiconductor wafers is a testament to his expertise and dedication to advancing technology.

This text is generated by artificial intelligence and may not be accurate.
Please report any incorrect information to support@idiyas.com
Loading…