Valery Deich

Title: Valery Deich: Innovator in Optical Metrology

Introduction

Valery Deich is a notable inventor based in Kiryat Arba, Israel. He has made significant contributions to the field of optical metrology, particularly through his innovative patent that enhances light detection methods.

Latest Patents

Valery Deich holds a patent titled "Polarized illumination and detection for metrological applications." This invention involves an apparatus and method designed to improve the proportion of detected light that has been diffusely scattered by a surface, as opposed to light that is specularly reflected from that surface. The apparatus directs a beam of light with a predominant polarization through a wedge module to illuminate the scene. The wedge module consists of two optically anisotropic wedges and an optical compensation plate. The polarization axes of the wedges are aligned with the direction of the predominant polarization of the illuminating beam. Light scattered by the surface is then detected through a polarizer, enhancing the accuracy of measurements in metrological applications.

Career Highlights

Valery Deich is associated with Optimet, Optical Metrology Ltd., where he applies his expertise in optical technologies. His work focuses on advancing measurement techniques that are crucial for various industrial applications.

Collaborations

Throughout his career, Valery has collaborated with notable colleagues, including Gabriel Y Sirat and Yaacov Zerem. These collaborations have contributed to the development of innovative solutions in the field of optical metrology.

Conclusion

Valery Deich's contributions to optical metrology through his patent and work at Optimet highlight his role as an influential inventor in the field. His innovative approaches continue to enhance the accuracy and efficiency of light detection methods.