Ulrich D Keil

Title: Ulrich D Keil: Innovator in Electro-Optic Sampling Technology

Introduction

Ulrich D Keil is a notable inventor based in Warren, NJ (US), recognized for his contributions to the field of electro-optic sampling. He holds a patent that showcases his innovative approach to enhancing the performance of electro-optic probes.

Latest Patents

Ulrich D Keil's patent, titled "Al.sub.x Ga.sub.1-x as probe for use in electro-optic sampling," introduces a new electro-optic sampling probe with femtosecond resolution. This advanced probe is significantly thinner and has a dielectric constant that is four times less than the best-reported conventional bulk LiTaO.sub.3 probes. Furthermore, the ultimate bandwidth of this probe is 50 percent greater than that of an equivalent LiTaO.sub.3 probe. The design utilizes a thin film of Al.sub.x Ga.sub.1-x As, which is effective in both total internally reflecting and free-standing geometries. The choice of x is critical for ensuring sufficient transmission of the crystal to the wavelength of the laser source used for electro-optic sampling. The film's thickness is a small fraction of prior art probes, optimized for speed and sensitivity in electro-optic sampling. This innovative thin film probe addresses many issues associated with bulk crystals used as electro-optic sensors.

Career Highlights

Ulrich D Keil is currently associated with AT&T Corp., where he continues to contribute to advancements in technology. His work has significantly impacted the field of electro-optic sampling, making it more efficient and effective.

Collaborations

He has collaborated with notable colleagues, including Douglas R Dykaar and Rose Fasano Kopf, who have also contributed to the advancements in this field.

Conclusion

Ulrich D Keil's innovative work in electro-optic sampling technology exemplifies the importance of advancements in this area. His contributions continue to influence the development of more efficient electro-optic probes.