Tung-Chun Lee

Title: Innovations of Tung-Chun Lee in Surface-Enhanced Spectroscopy

Introduction

Tung-Chun Lee is a notable inventor based in Cambridge, GB. He has made significant contributions to the field of surface-enhanced spectroscopy, particularly through his innovative patent. His work focuses on the detection of analytes using advanced spectroscopic techniques.

Latest Patents

Tung-Chun Lee holds a patent for "Plasmonic junctions for surface-enhanced spectroscopy." This invention relates to a construct designed for the detection of an analyte using surface-enhanced spectroscopic techniques. The construct features linked surfaces, where the link is formed by a linker that provides a fixed inter-surface separation between the linked surfaces. The linker is a linking compound, and at least one of the surfaces is the surface of a nanoparticle. The linking compound is suitable for interacting with the analyte and may include a cucurbituril. The surface-enhanced spectroscopic technique may involve surface-enhanced Raman spectroscopy (SERS). He has 1 patent to his name.

Career Highlights

Throughout his career, Tung-Chun Lee has demonstrated a commitment to advancing the field of spectroscopy. His innovative approaches have garnered attention and recognition within the scientific community. His work has implications for various applications, including chemical detection and analysis.

Collaborations

Tung-Chun Lee has collaborated with notable colleagues, including Richard William Taylor and Jeremy John Baumberg. These collaborations have contributed to the development and refinement of his innovative techniques.

Conclusion

Tung-Chun Lee's contributions to surface-enhanced spectroscopy highlight his role as a leading inventor in the field. His innovative patent demonstrates the potential for advancements in analyte detection and analysis. His work continues to inspire future innovations in spectroscopy.