Kobe, Japan

Tsunemasa Okada


Average Co-Inventor Count = 4.4

ph-index = 2

Forward Citations = 56(Granted Patents)


Company Filing History:


Years Active: 1976-1978

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2 patents (USPTO):Explore Patents

Title: Tsunemasa Okada: Innovator in Illumination Detection and Surface Defect Analysis

Introduction

Tsunemasa Okada is a notable inventor based in Kobe, Japan. He has made significant contributions to the fields of illumination detection and surface defect analysis. With a total of two patents to his name, Okada's work has advanced the technology used in photography and quality control.

Latest Patents

One of Okada's latest patents is the "Illumination Detecting and Recording Method and Device Therefor." This invention addresses the limitations of conventional color films, which require specific light sources for optimal performance. By improving the emulsion of the film, Okada's method allows for better printed images through simple corrections during the printing process. The invention includes a system for detecting and recording the type of illumination based on spectral properties and flickering noise detection, facilitating automatic film development.

Another significant patent is the "Automatic Defect-Detecting Method and Apparatus." This invention focuses on identifying effective surface defects using video signals and differential signals. By filtering out less significant density portions, the apparatus can accurately detect significant defects on surfaces treated with fluorescent magnetic powders.

Career Highlights

Throughout his career, Tsunemasa Okada has worked with prominent companies such as Fuji Photo Film Company, Limited and Konan Camera Research Institute Inc. His experience in these organizations has contributed to his expertise in the field of imaging technology.

Collaborations

Okada has collaborated with notable individuals in his field, including Sho Takahama and Katsuji Muramatsu. These partnerships have likely enriched his work and led to innovative solutions in his projects.

Conclusion

Tsunemasa Okada's contributions to illumination detection and surface defect analysis have made a lasting impact on technology in photography and quality control. His innovative patents reflect his dedication to improving existing methods and devices.

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