Title: Tsun-i Wang: Innovator in Wafer Inspection and Display Technology
Introduction
Tsun-i Wang is a notable inventor based in Taoyuan, Taiwan. He is currently associated with Dynascan Technology Corporation. Although he has not yet been granted any patents, his contributions to the field of technology are significant, particularly in wafer inspection and display apparatuses.
Latest Patent Applications
Tsun-i Wang has filed several innovative patent applications. One of his latest applications is for a **WAFER INSPECTION APPARATUS**. This apparatus performs a voltage inspection of a die on a wafer using a probe module. The probe module consists of a processing module, a first probe connected to a first electrode point of the die, and a second probe connected to a second electrode point. The processing module provides the die with a driving current through the first probe and obtains an inspection voltage that indicates the die's operating status. This innovation aims to reduce inspection costs and enhance efficiency.
Another significant application is for a **DISPLAY APPARATUS INCLUDING LED ARRAY**. This display apparatus features an LED array, a power source, a controller, a PWM switch, and a current source module. The controller generates a control signal to manage a first LED column during a scan period. The PWM switch is connected between the first LED column and a second power level, while the current source module provides a current flow with multiple levels. The PWM switch operates based on a portion of the control signal, allowing for dynamic control of the current flow during the scan period.
Conclusion
Tsun-i Wang is an innovative inventor whose work focuses on enhancing technology in wafer inspection and display systems. His latest patent applications reflect his commitment to improving efficiency and reducing costs in these fields.