Company Filing History:
Years Active: 2019-2022
Title: Tse-Tsun Chiu: Innovator in Leadframe Measurement Technology
Introduction
Tse-Tsun Chiu is a notable inventor based in Taipei, Taiwan. He has made significant contributions to the field of optical measurement technology, particularly in evaluating leadframe surfaces. With a total of 2 patents, his work has advanced the methods used in the industry.
Latest Patents
One of Tse-Tsun Chiu's latest patents is focused on single wavelength reflection for leadframe brightness measurement. This innovative method involves positioning a leadframe on a measurement apparatus at a predetermined distance from a light source of an optical sensor. The process includes irradiating a specific area on the leadframe's surface with light of a single predetermined wavelength. The reflected light is then received by the optical sensor's light receiver, which converts it into an electric signal. Subsequently, a reflection intensity value is determined based on this electric signal, allowing for the calculation of a reflection ratio in relation to a reference intensity value associated with the light source.
Career Highlights
Tse-Tsun Chiu is currently employed at Texas Instruments Corporation, where he continues to develop and refine his innovative technologies. His work has been instrumental in enhancing the accuracy and efficiency of leadframe surface evaluations.
Collaborations
Throughout his career, Tse-Tsun Chiu has collaborated with talented individuals such as Hung-Yu Chou and Chien-Hao Wang. These partnerships have fostered a creative environment that has led to the development of cutting-edge technologies.
Conclusion
Tse-Tsun Chiu's contributions to leadframe measurement technology exemplify his dedication to innovation. His patents reflect a commitment to improving industry standards and practices.