Trina Lee

Title: Trina Lee: Innovator in Damage Analysis Technology

Introduction

Trina Lee is a notable inventor based in Northbrook, IL (US). She has made significant contributions to the field of damage analysis through her innovative patent. Her work focuses on utilizing advanced systems and methods to assess the condition of objects and calculate potential damages.

Latest Patents

Trina Lee holds a patent for a system generated damage analysis using scene templates. This patent describes systems, methods, and computer-readable media that can obtain various data regarding the condition of an object. The technology calculates probabilistic likelihoods of causes and/or the value of damages to the object. In various embodiments, data from third-party systems can be utilized in these calculations. Machine classifiers are employed to generate probabilistic likelihoods and confidence metrics in the calculated liabilities. Additionally, user interfaces are designed to efficiently obtain and visualize the object, surrounding geographic conditions, and probabilistic likelihoods. These interfaces may include a scene sketch tool application program interface and a liability tool user interface, which can dynamically generate diagrams of object damage and the environment in which the object was damaged.

Career Highlights

Trina Lee is currently employed at Allstate Insurance Company, where she applies her expertise in damage analysis technology. Her innovative approach has positioned her as a valuable asset within the company.

Collaborations

Trina collaborates with talented coworkers, including Yatin Patel and Kevin Fischer, who contribute to her projects and enhance the overall effectiveness of their work.

Conclusion

Trina Lee's contributions to damage analysis technology demonstrate her innovative spirit and commitment to improving systems for assessing object conditions. Her patent reflects a significant advancement in the field, showcasing her expertise and dedication to innovation.