Company Filing History:
Years Active: 2025
Title: Tomohiko Shiota: Innovator in Thickness Measurement Technology
Introduction
Tomohiko Shiota is a prominent inventor based in Tokyo, Japan. He is known for his contributions to the field of thickness measurement technology. His innovative approach has led to the development of a unique device that enhances the accuracy of thickness measurements in various applications.
Latest Patents
Shiota holds a patent for a thickness measurement device and method. This device includes an ultrasonic transmitter that transmits ultrasonic waves to a measurement object. It also features an ultrasonic receiver that captures the reflected waves from the measurement object. The device is designed with a first extraction unit to extract the first reflected wave from the object's surface and a second extraction unit to identify multiple candidates for the second reflected wave. A matching degree calculation unit assesses the matching degree between the first reflected wave and each candidate. Finally, a candidate determination unit selects the candidate with the highest matching degree, allowing for precise thickness calculations.
Career Highlights
Tomohiko Shiota is currently employed at IHI Corporation, where he continues to innovate and develop advanced measurement technologies. His work has significantly impacted the industry, providing solutions that enhance measurement accuracy and efficiency.
Collaborations
Shiota collaborates with notable colleagues, including Seiichi Ohmori and Masahiro Hato. Their combined expertise contributes to the advancement of technology within their field.
Conclusion
Tomohiko Shiota's innovative contributions to thickness measurement technology exemplify his dedication to advancing the field. His patented device showcases his ability to merge technology with practical applications, making a significant impact in the industry.