Todd C Fellows

Title: Innovations by Todd C Fellows

Introduction

Todd C Fellows is an accomplished inventor based in Endicott, NY (US). He has made significant contributions to the field of optical inspection technology. With a total of three patents to his name, his work focuses on enhancing the capabilities of inspection systems.

Latest Patents

One of Todd's latest patents is a dual mode illumination system for optical inspection. This innovative system is designed to detect surface defects and defects in holes of products. It utilizes a first light source positioned on one side of the product to illuminate holes, while a second light source illuminates the surface from the opposite side. A beam splitter redirects light to a sensor, which may be a video camera connected to a data processing and display system. Another notable patent is an analog video processing apparatus and method for eliminating background. This system enhances imaging integrity by removing background video components, thereby improving the signal-to-noise ratio and increasing inspection capabilities.

Career Highlights

Todd C Fellows is currently employed at International Business Machines Corporation (IBM). His role at IBM allows him to apply his innovative ideas and contribute to advancements in technology. His patents reflect his commitment to improving optical inspection processes.

Collaborations

Throughout his career, Todd has collaborated with notable coworkers such as Peter J Yablonsky and Donald H Canfield. These collaborations have likely enriched his work and contributed to the development of his patented technologies