Livermore, CA, United States of America

Todd A Palmer


Average Co-Inventor Count = 3.3

ph-index = 4

Forward Citations = 24(Granted Patents)


Location History:

  • Livermore, CA (US) (2007 - 2008)
  • State College, PA (US) (2011)

Company Filing History:


Years Active: 2007-2011

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5 patents (USPTO):Explore Patents

Title: The Innovations of Todd A. Palmer

Introduction

Todd A. Palmer is a notable inventor based in Livermore, CA, with a focus on advancements in diagnostic systems for electron and ion beams. He holds a total of 5 patents that reflect his expertise and contributions to the field.

Latest Patents

Among his latest innovations is the "Slit disk for modified Faraday cup diagnostic for determining power density of electron and ion beams." This diagnostic system features an electrically conducting disk made of refractory material, designed to characterize electron and ion beams effectively. The disk includes at least one slit that allows for diagnostic characterization, providing valuable insights into the behavior of these beams.

Another significant patent is the "Miniature modified Faraday cup for micro electron beams." This assembly incorporates a refractory metal layer with an odd number of thin, radially positioned traces. These traces are strategically placed to form multiple independent diagnostic networks, enabling the reconstruction of beam shape, size, and power density distribution through advanced data acquisition techniques.

Career Highlights

Todd has made significant contributions while working at Lawrence Livermore National Security, LLC, and the University of California. His work in these esteemed institutions has furthered research and development in the field of electron and ion beam diagnostics.

Collaborations

Throughout his career, Todd has collaborated with notable colleagues, including Alan T. Teruya and John W. Elmer. These partnerships have enhanced the quality and impact of his inventions.

Conclusion

Todd A. Palmer's innovative work in the field of diagnostic systems for electron and ion beams showcases his dedication to advancing technology. His patents reflect a commitment to improving diagnostic capabilities, making significant contributions to the scientific community.

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