Company Filing History:
Years Active: 2001
Title: Thomas W Bachelder: Innovator in Wafer Testing Technology
Introduction
Thomas W Bachelder is a notable inventor based in Swanton, Vermont, known for his contributions to the field of integrated circuit testing. He holds a patent for an innovative apparatus designed to enhance the efficiency of testing and burning in integrated circuit chips on product wafers. His work has significant implications for the semiconductor industry.
Latest Patents
Bachelder's patent, titled "Segmented architecture for wafer test and burn-in," describes an apparatus that allows for the simultaneous testing or burning in of a large number of integrated circuit chips. This invention features probes mounted on a first board and tester chips on a second board, connected by electrical connectors. The design ensures that the tester chips remain at a lower temperature than the product chips during the burn-in process, thereby extending their lifespan. The arrangement of probes in crescent-shaped stripes significantly increases testing throughput compared to traditional area array configurations.
Career Highlights
Bachelder is associated with the International Business Machines Corporation (IBM), where he has made substantial contributions to the development of testing technologies for integrated circuits. His innovative approach to wafer testing has positioned him as a key figure in advancing semiconductor testing methodologies.
Collaborations
Throughout his career, Bachelder has collaborated with notable colleagues, including Dennis R Barringer and Dennis R Conti. These partnerships have fostered a collaborative environment that has led to significant advancements in the field.
Conclusion
Thomas W Bachelder's contributions to wafer testing technology exemplify the impact of innovation in the semiconductor industry. His patented apparatus not only improves testing efficiency but also enhances the longevity of testing equipment. Bachelder's work continues to influence the development of integrated circuit testing methodologies.