Company Filing History:
Years Active: 1990
Title: Thomas E. Capobianco: Innovator in Nondestructive Testing
Introduction
Thomas E. Capobianco is a notable inventor based in Arvada, Colorado. He has made significant contributions to the field of nondestructive testing, particularly through his innovative patent that enhances the calibration of eddy current probes. His work is essential for ensuring the integrity of metal components, especially in critical applications such as aircraft frameworks.
Latest Patents
Capobianco holds a patent for a "Reference Standard Block for Use in Nondestructive Test Probe." This invention involves a reference standard and a method for manufacturing it, aimed at calibrating eddy current probes. The reference standard is created from a block of metal that is deformed by an indentation tool to form a notch of specific dimensions. The standard is then compressed along an axis that is substantially transverse to the longitudinal axis of the notch, effectively closing the notch. This innovative approach allows for the production of a family of reference standards that can be used to calibrate eddy current probes before they are employed in evaluating metal components for fatigue cracks and other issues.
Career Highlights
Capobianco's career is marked by his dedication to advancing nondestructive testing methodologies. He works for the Government of the United States of America, as represented by the Secretary of Commerce. His role involves collaborating with various professionals to enhance testing standards and practices.
Collaborations
Throughout his career, Capobianco has worked alongside esteemed colleagues such as William P. Dube and Kenneth W. Fizer. These collaborations have contributed to the development of innovative solutions in the field of nondestructive testing.
Conclusion
Thomas E. Capobianco's contributions to nondestructive testing through his patent and collaborative efforts highlight his importance in the field. His work not only advances technology but also ensures safety and reliability in critical applications.