Company Filing History:
Years Active: 1992
Title: Thomas B. Albrecht: Innovator in Scanning Probe Microscopy
Introduction
Thomas B. Albrecht is a notable inventor based in San Jose, California. He has made significant contributions to the field of scanning probe microscopy, particularly through his innovative designs and patents. His work has advanced the capabilities of these sophisticated instruments, which are essential in various scientific and industrial applications.
Latest Patents
One of Thomas B. Albrecht's key patents is titled "Universal, microfabricated probe for scanning probe microscopes." This invention presents a universal probe that can be utilized with various types of scanning probe microscopes. The probe is mounted on a flexible base, which can either be a flexible cantilevered beam or a flexible membrane. The design features a sharply tapered probe that generally forms a squat hollow pyramid or cone. The apex of this structure has an aperture defined through it, with a small controlled diameter ranging from 10 to 50,000 Angstroms. The hollow interior of the probe is filled with a material selected based on the type of scanning probe microscope used and the underlying surface. A signal is transmitted to the material in the tip of the probe from the scanning probe microscope, allowing it to interact effectively with the underlying surface. This patent showcases Albrecht's innovative approach to enhancing the functionality of scanning probe microscopes.
Career Highlights
Thomas B. Albrecht has had a distinguished career, primarily associated with the University of California. His work at this prestigious institution has allowed him to collaborate with other leading researchers and contribute to advancements in microscopy technology. His dedication to research and innovation has earned him recognition in the scientific community.
Collaborations
One of his notable collaborators is Craig B. Prater. Together, they have worked on various projects that have furthered the understanding and application of scanning probe microscopy.
Conclusion
Thomas B. Albrecht's contributions to the field of scanning probe microscopy through his innovative patent demonstrate his commitment to advancing technology in this area. His work continues to influence the development of new tools and techniques in scientific research.