Thien Trieu

Title: Thien Trieu: Innovator in Memory Testing Technology

Introduction

Thien Trieu is a notable inventor based in Fremont, California. He has made significant contributions to the field of memory technology, particularly in testing methods that enhance the reliability of memory operations. His innovative approach addresses critical challenges in memory refresh operations.

Latest Patents

Thien Trieu holds a patent for a method of testing memory refresh operations wherein subthreshold leakage is minimized. This patent outlines a technique for testing refresh operations of a memory array under near worst-case conditions. The method involves storing specific logic values in memory cells and driving a write bit line to ensure accurate testing of memory functionality. This innovative approach allows for the assessment of memory cells while accounting for subthreshold leakage currents, thereby improving the reliability of memory devices.

Career Highlights

Thien Trieu is associated with LSI Logic Corporation, where he has applied his expertise in memory technology. His work has contributed to advancements in the efficiency and performance of memory systems. With a focus on practical applications, he has developed methods that are crucial for the testing and validation of memory arrays.

Collaborations

Thien has collaborated with esteemed colleagues such as Thomas R. Wik and Tuan L. Phan. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas in the field of memory technology.

Conclusion

Thien Trieu's contributions to memory testing technology exemplify the importance of innovation in enhancing the reliability of memory systems. His patented methods are a testament to his expertise and commitment to advancing technology in this critical area.