Location History:
- Kennett Square, PA (US) (1976)
- Dushore, PA (US) (1976 - 1991)
Company Filing History:
Years Active: 1976-1991
Title: The Innovations of Theodore P. Christini
Introduction
Theodore P. Christini is a notable inventor based in Dushore, PA (US). He has made significant contributions to the field of X-ray technology, holding a total of 5 patents. His work has focused on improving the performance and durability of X-ray intensifying screens.
Latest Patents
One of his latest patents is titled "Adhesion between phosphor and topcoat layers of an X-ray intensifying." This invention features an improved X-ray intensifying screen element that includes a topcoat layer made from an acrylonitrile-styrene copolymer, which may be mixed with a carboxylated acrylic polymer. The active phosphor layer contains a soluble inorganic salt that promotes adhesion. This innovative element demonstrates strong adhesion between the topcoat and active layers, making it suitable for the rough handling encountered in autochangers and similar applications. Another significant patent is "X-ray intensifying screen with improved topcoat." This invention enhances the performance characteristics of X-ray intensifying screens by utilizing an acrylonitrile/styrene copolymer composition as the protective topcoat, making it ideal for automatic X-ray changer systems.
Career Highlights
Throughout his career, Theodore P. Christini has worked with prominent companies, including E.I. DuPont De Nemours and Company. His expertise in the field has allowed him to develop innovative solutions that address the challenges faced in X-ray technology.
Collaborations
He has collaborated with notable individuals such as Albert Lawrence Eustice and Arthur Hughes Graham, contributing to advancements in his field.
Conclusion
Theodore P. Christini's contributions to X-ray technology through his patents and collaborations highlight his innovative spirit and dedication to improving medical imaging. His work continues to influence the industry and enhance the functionality of X-ray systems.