Yokohama, Japan

Takeshi Furukawa


Average Co-Inventor Count = 2.9

ph-index = 1

Forward Citations = 6(Granted Patents)


Location History:

  • Kanagawa, JP (2000)
  • Yokohama, JP (1983 - 2004)

Company Filing History:


Years Active: 1983-2004

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3 patents (USPTO):Explore Patents

Title: Innovations of Takeshi Furukawa

Introduction

Takeshi Furukawa is a notable inventor based in Yokohama, Japan. He has made significant contributions to the field of memory testing and data processing, holding a total of three patents. His work has been influential in enhancing the efficiency and versatility of memory testing programs.

Latest Patents

One of Furukawa's latest patents is a memory testing method. This method allows for the input of correspondence information from external sources to the memory testing program, accommodating various internal configurations of memory. This innovation enables the versatile use of memory testing programs, even when the internal configuration is unclear. Another significant patent is a data processor testing apparatus and method. This invention involves preparing an instruction string for testing access to cache memories and invalidating access data with a BI signal, ensuring that the results of invalidation are acceptable.

Career Highlights

Furukawa has worked with prominent companies such as Fujitsu Corporation and Nippon Kokan Kabushiki Kaisha. His experience in these organizations has contributed to his expertise in memory and data processing technologies.

Collaborations

Throughout his career, Furukawa has collaborated with notable colleagues, including Shinichi Nakamura and Satoshi Sato. These collaborations have further enriched his work and innovations in the field.

Conclusion

Takeshi Furukawa's contributions to memory testing and data processing are significant, showcasing his innovative spirit and technical expertise. His patents reflect a commitment to advancing technology in these areas.

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