Company Filing History:
Years Active: 2008
Title: The Innovations of Takayoshi Kishimoto
Introduction
Takayoshi Kishimoto is a notable inventor based in Fukui, Japan. He has made significant contributions to the field of switch devices, holding a total of 2 patents. His work is characterized by innovative designs that enhance the functionality and reliability of electronic devices.
Latest Patents
Kishimoto's latest patents include a unique switch device that features a U-shaped spring member. This spring member is strategically placed on the outer periphery of a hollow cylindrical part of an operating body. The engaging portions in the arm portions extend upwardly inwardly from both ends of the spring member, fitting into holes through the hollow cylindrical part. This design ensures resilient contact with a groove on the outer periphery of an operating shaft, providing a switch device that boasts great resistance to pull-out of the operating body for secure fastening and ease of assembly. Another notable patent is a switch device that includes an operation body and a membrane switch activated by the operation body. This design allows for multiple push switches to be activated without operating errors, enhancing user experience.
Career Highlights
Kishimoto is associated with Matsushita Electric Industrial Co., Ltd., a company renowned for its advancements in electronic technology. His work at this esteemed organization has allowed him to develop innovative solutions that address common challenges in electronic device functionality.
Collaborations
Throughout his career, Kishimoto has collaborated with talented individuals such as Masahiro Hirobe and Kenji Otomo. These collaborations have fostered an environment of creativity and innovation, leading to the development of groundbreaking technologies.
Conclusion
Takayoshi Kishimoto's contributions to the field of switch devices exemplify his innovative spirit and dedication to enhancing electronic technology. His patents reflect a commitment to improving user experience and device reliability.