Kobe, Japan

Takahiro Saino



Average Co-Inventor Count = 5.4

ph-index = 2

Forward Citations = 11(Granted Patents)


Company Filing History:


Years Active: 2017-2025

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4 patents (USPTO):Explore Patents

Title: Takahiro Saino: Innovator in Sample Analysis Technology

Introduction

Takahiro Saino is a prominent inventor based in Kobe, Japan. He has made significant contributions to the field of sample analysis technology, holding a total of four patents. His work focuses on improving the efficiency and accuracy of sample analyzers, which are essential in various scientific and medical applications.

Latest Patents

One of Saino's latest patents is a "Method for notifying sample analyzer status and sample analysis system." This invention presents a status notification method for sample analyzers, which includes a detection step for identifying the status of the analyzer and an irradiating step for emitting light based on the detected status. Another notable patent is the "Sample measurement apparatus and method of measuring samples." This apparatus features a processing unit that aspirates and measures samples, a transfer unit that holds and moves sample containers, and a detection unit that checks for the presence of sample containers at storage positions.

Career Highlights

Takahiro Saino is currently employed at Sysmex Corporation, a company known for its innovative medical diagnostic solutions. His work at Sysmex has allowed him to develop cutting-edge technologies that enhance the capabilities of sample analysis systems.

Collaborations

Saino collaborates with talented individuals such as Mitsuo Yamasaki and Tomonori Okazaki. Their combined expertise contributes to the advancement of technologies in the field of sample analysis.

Conclusion

Takahiro Saino's contributions to sample analysis technology through his patents and work at Sysmex Corporation highlight his role as an influential inventor. His innovations continue to impact the efficiency and effectiveness of sample analysis in various applications.

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