Takahiro Nihei

Title: Takahiro Nihei: Innovator in Low-Temperature Testing of IC Devices

Introduction

Takahiro Nihei is a notable inventor based in Fukushima, Japan. He has made significant contributions to the field of integrated circuit (IC) device testing, particularly at low temperatures. His innovative approach has led to the development of specialized apparatuses that enhance the performance evaluation of IC devices.

Latest Patents

Takahiro Nihei holds a patent for an "Apparatus for testing IC devices at low temperature and cooling bag." This invention includes a cooling disk designed to be cooled with liquid nitrogen or similar refrigerants, allowing for effective cooling of IC devices during testing. Additionally, his cooling bag is engineered to intimately contact the IC device while enclosing a refrigerant, ensuring optimal temperature conditions. Another variant of his testing apparatus features a cooling bag reeved around drive and idler rollers, functioning as a belt conveyor to cool IC devices being transported.

Career Highlights

Throughout his career, Takahiro Nihei has worked with prominent companies such as Kabushiki Kaisha Kobe Seiko Sho and Japan LSI Co., Ltd. His experience in these organizations has contributed to his expertise in the field of IC device testing and innovation.

Collaborations

Takahiro Nihei has collaborated with notable individuals in his field, including Osamu Morioka and Keizo Tokushige. These partnerships have likely fostered a rich exchange of ideas and advancements in technology.

Conclusion

Takahiro Nihei's contributions to low-temperature testing of IC devices exemplify his innovative spirit and dedication to advancing technology. His patent and career achievements reflect his significant impact on the industry.