Albuquerque, NM, United States of America

Tai Won Youn

USPTO Granted Patents = 7 

Average Co-Inventor Count = 1.1

ph-index = 4

Forward Citations = 92(Granted Patents)


Company Filing History:


Years Active: 2009-2013

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7 patents (USPTO):Explore Patents

Title: Innovations of Tai Won Youn

Introduction

Tai Won Youn is a notable inventor based in Albuquerque, NM (US). He has made significant contributions to the field of RFID technology, holding a total of 7 patents. His work focuses on improving the efficiency and reliability of RFID tags, which are essential in various applications, including automotive and logistics.

Latest Patents

One of Tai Won Youn's latest patents is a method and apparatus for testing RFID tags for mass production. This innovative testing system is designed for glass-mounted RFID tags, such as those found on vehicle windows. The system includes a testing carrier that simulates the effect of mounting glass on the tag. The test chamber and carrier are calibrated by first mounting the tag on the test carrier and making sensitivity measurements. Comparisons are then made between these measurements and those taken with the tag mounted on actual glass, allowing for the derivation of calibration factors to compensate for differences. The design of the test carrier ensures uniform pressure against the tag, minimizing distortions that could affect sensitivity.

Another significant patent involves a circuit with improved electrostatic discharge susceptibility. In this design, an RFID tag incorporates a capacitor between the ASIC ground pin and the circuit ground. The capacitor is selected to ensure that during electrostatic discharge (ESD), the potential drop occurs primarily across the capacitor, thereby protecting the ASIC from damage.

Career Highlights

Throughout his career, Tai Won Youn has worked with several companies, including Tc License, Ltd. and Amtech Systems, Incorporated. His experience in these organizations has contributed to his expertise in RFID technology and innovation.

Collaborations

Tai has collaborated with notable professionals in his field, including Jeremy Landt and Matthew K Burnett. Their combined efforts have further advanced the development of RFID technologies.

Conclusion

Tai Won Youn's contributions to RFID technology through his patents and collaborations highlight his role as an influential inventor. His innovative approaches continue to shape the future of this essential technology.

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