Bengaluru, India

Swarnim Narayan

USPTO Granted Patents = 1 

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Swarnim Narayan: Innovator in Machine Learning Data Dependency Extraction

Introduction

Swarnim Narayan is a notable inventor based in Bengaluru, India. He has made significant contributions to the field of machine learning, particularly in the area of data dependency extraction. His innovative approach addresses critical challenges in anomaly detection and data management within machine learning models.

Latest Patents

Swarnim Narayan holds a patent for a "Method and system to extract data dependencies for machine learning models." This patent outlines techniques for anomaly detection using sparse judgmental samples. The methods include generating a plurality of tokens from a textual representation of a machine learning model through lexical analysis. Additionally, it involves creating an abstract syntax tree (AST) based on these tokens. The AST helps identify data dependencies of the machine learning model, indicating its reliance on specific data sources. Furthermore, the techniques enable the detection of potential issues associated with these data sources, allowing for timely alert notifications.

Career Highlights

Swarnim Narayan is currently employed at Microsoft Technology Licensing, LLC, where he continues to develop innovative solutions in technology. His work focuses on enhancing the efficiency and reliability of machine learning applications.

Collaborations

Swarnim has collaborated with notable colleagues, including Laurent Boue and Kiran Rama, contributing to a dynamic and innovative work environment.

Conclusion

Swarnim Narayan's contributions to machine learning through his patent and work at Microsoft Technology Licensing, LLC highlight his role as a key innovator in the field. His techniques for data dependency extraction are paving the way for advancements in anomaly detection and machine learning reliability.

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