Company Filing History:
Years Active: 2025
Title: Suzan Van Der Lee: Innovator in Electrical Impedance Tomography
Introduction
Suzan Van Der Lee is a prominent inventor based in Evanston, IL (US). She has made significant contributions to the field of electrical impedance tomography, showcasing her innovative spirit and technical expertise.
Latest Patents
Suzan holds a patent for an optimized electrical impedance tomography method. This 2-D resistance tomographic imaging method enhances computation speed by utilizing a model-space with a minimal number of orthonormal polynomial basis functions. It effectively describes discernable features in the 2-D resistance tomographic image. The method determines a minimal number of contacts to take fewer measurements than available information based on the number of basis functions. Additionally, it selects a subset of rows from a matrix of calculated sensitivity coefficients to form a square Jacobian matrix for solving a linearized forward problem. The process includes the inversion of the linear forward problem and solving an inverse problem based on the square Jacobian matrix by performing at least one iteration of a Newton's method solve.
Career Highlights
Suzan is affiliated with Northwestern University, where she continues to advance her research and innovation in electrical engineering. Her work has garnered attention for its practical applications and contributions to the field.
Collaborations
Suzan collaborates with Chulin Wang, who is also a notable figure in her research endeavors. Their partnership exemplifies the collaborative spirit in academic and research institutions.
Conclusion
Suzan Van Der Lee's innovative work in electrical impedance tomography highlights her role as a leading inventor in her field. Her contributions not only advance technology but also pave the way for future innovations.