Location History:
- Plansboro, NJ (US) (1999)
- Plainsboro, NJ (US) (2001)
- Marlboro, MA (US) (2002)
Company Filing History:
Years Active: 1999-2002
Title: Surendra K Bommu: Innovator in Circuit Testing Technologies
Introduction
Surendra K Bommu is a notable inventor based in Marlboro, MA (US). He has made significant contributions to the field of circuit testing, holding a total of 4 patents. His innovative methods focus on enhancing the efficiency and effectiveness of testing sequential circuits.
Latest Patents
One of his latest patents is titled "Segmented compaction with pruning and critical fault elimination." This method involves generating a vector set used for testing sequential circuits. The process includes selecting multiple fault models, identifying fault lists for each model, and compacting vector sets to ensure all faults are identified or that fault list coverage remains within a specified tolerance limit. Another significant patent is "On-line partitioning for sequential circuit test generation." This method addresses test generation problems by recursively dividing them into smaller, manageable sub-problems. It emphasizes the reuse of solutions for dependent sub-problems and aims to identify minimal subsets of conflicting objectives.
Career Highlights
Surendra K Bommu is currently employed at NEC USA, Inc., where he continues to develop innovative solutions in circuit testing. His work has been instrumental in advancing methodologies that improve the reliability and efficiency of electronic testing processes.
Collaborations
He collaborates with talented coworkers, including Srimat T Chakradhar and Kiran B Doreswamy, who contribute to the innovative environment at NEC USA, Inc.
Conclusion
Surendra K Bommu's contributions to circuit testing technologies through his patents and collaborative efforts highlight his role as a key innovator in the field. His work continues to influence advancements in electronic testing methodologies.