Company Filing History:
1 out of 12 
1 out of 832,680 Years Active: 1994-1996
Title: Innovations of Sung-il Park in Scanning Probe Microscopy
Introduction
Sung-il Park is a notable inventor based in San Jose, CA (US). He has made significant contributions to the field of microscopy, particularly through his innovative designs and patents. With a total of 2 patents, his work has advanced the capabilities of scanning probe microscopes.
Latest Patents
One of his latest patents involves a scanning probe microscope that boasts numerous advantages. This invention features scanning force and scanning tunneling probes that are removably mounted in the head using kinematic mounting techniques. This design allows for easy substitution of probes without the need to adjust the cantilever deflection sensor. Additionally, a linear position-sensitive photodetector in the deflection sensor further eliminates the need for adjustments. The microscope includes a motorized, non-stacked x,y coarse movement stage that is kinematically positioned with respect to the base, minimizing mechanical loops to reduce thermal and vibrational effects on the sample's position. A z coarse movement stage is also included, allowing for precise adjustments in height, tilt, and pitch of the probe. The scanner is equipped with x,y and z sample position detectors that provide accurate measurements of the sample's position relative to the probe. The z position detector outputs data that is exclusive of sample tilt, enhancing the functionality of the scanning probe microscope.
Career Highlights
Sung-il Park has worked with Park Scientific Instruments, where he has further developed his expertise in microscopy. His innovative contributions have positioned him as a key figure in the field.
Collaborations
Throughout his career, he has collaborated with notable individuals such as Frederick I Linker and Michael D Kirk. These collaborations have likely enriched his work and led to further advancements in his inventions.
Conclusion
Sung-il Park's contributions to scanning probe microscopy demonstrate his innovative spirit and technical expertise. His patents reflect a commitment to enhancing the capabilities of scientific instruments, making significant strides in the field.
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