Sumit DasGupta

Title: The Innovations of Sumit DasGupta

Introduction

Sumit DasGupta is a notable inventor based in Austin, TX. He has made significant contributions to the field of integrated circuit testing. His work focuses on enhancing the reliability and efficiency of chip I/O testing.

Latest Patents

Sumit holds a patent for a system and method titled "Complete chip I/O test through low contact testing using enhanced." This invention evaluates solder ball connections to flip-chip integrated circuit devices. It extends boundary scan testing circuits and techniques to verify the existence, size, and connective efficacy of solder balls deposited on pads. The inclusion of a boundary scan driver and receiver with each pad allows for the verification of all electrical connections in the path. This innovation enables low contact testing to ensure the integrity of integrated circuits and solder ball type die output contacts.

Career Highlights

Sumit DasGupta is currently employed at International Business Machines Corporation, commonly known as IBM. His work at IBM has allowed him to develop and refine his innovative testing methods. He has been instrumental in advancing the technology used in integrated circuit testing.

Collaborations

Some of his notable coworkers include Kris V Srikrishnan and Ronald Gene Walther. Their collaboration has contributed to the success of various projects within the company.

Conclusion

Sumit DasGupta's contributions to the field of integrated circuit testing exemplify the importance of innovation in technology. His patent reflects a significant advancement in ensuring the reliability of electronic devices.