Steven S Wei

Title: Innovations of Steven S. Wei in Integrated Circuit Testing

Introduction

Steven S. Wei, an inventive mind based in San Diego, California, holds a patent that revolutionizes the testing of integrated circuits. His work in the field not only showcases his ingenuity but also contributes significantly to the semiconductor industry.

Latest Patents

Wei's most notable patent is focused on a unique test wafer designed for diagnosing flaws in integrated circuit fabrication. This test wafer employs a semiconductor substrate with a diagnostic circuit integrated over the majority of the wafer's surface. The innovative design incorporates a series of ring oscillators that generate cyclic output signals, which are essential for quick detection of alternating current (A-C) defects during the fabrication process.

Each diagnostic circuit within the wafer is equipped with an addressing circuit to select signals from the ring oscillators and a timing circuit that generates a timing signal. This setup allows the counting circuit to tally the cycles of output signals within a specified time frame, facilitating the identification of defective rings. By comparing the performance of the ring oscillators, flaws can be accurately diagnosed, and problematic oscillators can be examined further using an E-beam microscope, enabling precise fault analysis.

Career Highlights

Steven S. Wei has been instrumental in his role at Unisys Corporation, where his contributions extend beyond the patented technology. His expertise in integrated circuits and diagnostics significantly enhances the company's capabilities in semiconductor testing and quality assurance.

Collaborations

Throughout his career at Unisys Corporation, Wei has collaborated with talented colleagues, including Cevat Kumbasar and Jonathan A. Levi. Together, they have exchanged ideas and supported each other in advancing the company's technological innovations.

Conclusion

The contributions of Steven S. Wei in the realm of integrated circuit testing exemplify the essence of innovation in the technology industry. His patent for the diagnostic test wafer not only streamlines the detection of A-C defects but also sets a precedence for future advancements in semiconductor fabrication processes. As he continues his work, Wei's impact on the field is sure to flourish.