Albuquerque, NM, United States of America

Steve W Farrer


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 11(Granted Patents)


Company Filing History:


Years Active: 2004

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1 patent (USPTO):Explore Patents

Title: The Innovations of Steve W. Farrer in Structure Identification

Introduction

Steve W. Farrer is an innovative inventor based in Albuquerque, NM, who has made significant strides in the field of structure identification. With a total of one patent to his name, he has developed a method that enhances the efficiency of referencing and identifying structures through advanced signal processing techniques.

Latest Patents

Farrer’s patent, titled "Structure Identification Using Scattering Signatures," presents a novel method for pruning a reference library of signatures and their corresponding known structure parameter vectors. This method involves creating a reference signal vector and interpolating its parameter vector while eliminating the original reference signal vector if the interpolation error is sufficiently small. Additionally, it offers a systematic approach to accessing an indexed reference library by acquiring an unknown signal, calculating an index vector for it, and determining the error against the reference signal index vector. This innovative approach aids in identifying match candidates for unknown signals, marking a substantial advancement in the field.

Career Highlights

Currently, Farrer is associated with Accent Optical Technologies, Inc., where he continues to push the boundaries of technology and innovation. His work is centered on enhancing optical technologies that can classify structures with precision.

Collaborations

Throughout his career, Farrer has worked alongside esteemed colleagues such as Richard H. Krukar and Christopher J. Raymond. Their collaborative efforts contribute to the advancements made in their respective fields, particularly in optical technologies and structure identification methodologies.

Conclusion

In summary, Steve W. Farrer’s contributions to the realm of structure identification through his innovative patent underlines his role as a significant figure in the development of advanced technologies. His ongoing work at Accent Optical Technologies, Inc. continues to pave the way for future innovations that can redefine how we approach structure identification in various applications.

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