Company Filing History:
Years Active: 1985-1986
Title: Innovations by Stephen J Erasmus
Introduction
Stephen J Erasmus is a notable inventor based in Mountain View, CA (US). He has made significant contributions to the field of electron beam instruments, holding 2 patents that showcase his innovative approach to technology.
Latest Patents
One of his latest patents focuses on the correction of astigmatism in electron beam instruments. This invention involves an electron beam instrument equipped with an objective lens coil and stigmator coils. The astigmatism is corrected by measuring the contrast in the final image. The currents through the objective lens and stigmator coils are adjusted iteratively to optimize the contrast, which can be either a maximum or minimum depending on the instrument's operation mode. The measurement of contrast can be achieved by calculating the variance of successive points of an image or by measuring the covariance of two magnitude measurements at each point.
Another significant patent by Erasmus pertains to scanning transmission electron microscopes. In this invention, the image of the diffraction pattern formed on a phosphor screen is converted into a video signal and digitized for storage. The stored signal is modified by a weighting factor that represents a notional pattern overlaying the screen. This allows for the construction of a complete picture point-by-point, enhancing the efficiency of the imaging process.
Career Highlights
Stephen J Erasmus is currently associated with the National Research Development Corporation, where he continues to innovate and contribute to advancements in electron beam technology.
Collaborations
Erasmus has worked alongside Kenneth C Smith, collaborating on various projects that leverage their combined expertise in the field.
Conclusion
Stephen J Erasmus is a distinguished inventor whose work in electron beam instruments has led to significant advancements in technology. His innovative patents reflect his commitment to improving the functionality and efficiency of scientific instruments.