Schwieberdingen, Germany

Stefan Meyer


Average Co-Inventor Count = 2.0

ph-index = 2

Forward Citations = 6(Granted Patents)


Location History:

  • Asperg, DE (1994)
  • Schwieberdingen, DE (2007)

Company Filing History:


Years Active: 1994-2007

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3 patents (USPTO):

Title: Innovations of Stefan Meyer in Layer Thickness Measurement

Introduction

Stefan Meyer is a notable inventor based in Schwieberdingen, Germany. He has made significant contributions to the field of contactless measurement technologies, particularly in determining the thickness of layers made of electrically-conductive materials. With a total of 3 patents to his name, Meyer continues to push the boundaries of innovation in his field.

Latest Patents

Meyer’s latest patents include a method for the contactless determination of a layer thickness via resistance and inductance measurement of a sensor oil. This method utilizes a sensor composed of a coil form and a coil positioned near the component to be measured. The technique is based on the principles of induction and eddy current, allowing for precise measurements through a series of evaluation steps. The thickness of the layer is determined by evaluating the inductance and resistance values of the coil when acted upon by alternating current frequencies.

Another significant patent by Meyer is a method for the contactless determination of a thickness of a layer made of electrically-conductive material. Similar to his previous patent, this method employs a sensor with a coil form and coil positioned near the component. The evaluation of the change in inductance at different alternating current frequencies enables accurate measurement of the layer thickness.

Career Highlights

Stefan Meyer is currently employed at Robert Bosch GmbH, where he applies his expertise in measurement technologies. His work has been instrumental in advancing the capabilities of contactless measurement systems, making them more efficient and reliable.

Collaborations

Meyer has collaborated with notable colleagues such as Hansjoerg Hachtel and Matthias Entenmann. These collaborations have fostered an environment of innovation and have contributed to the development of advanced measurement techniques.

Conclusion

Stefan Meyer’s contributions to the field of contactless measurement technologies are noteworthy. His innovative methods for determining layer thickness have the potential to enhance various industrial applications. Through his work at Robert Bosch GmbH and collaborations with esteemed colleagues, Meyer continues to make strides in the realm of measurement technology.

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