Rochester, NY, United States of America

Stanley Gross


Average Co-Inventor Count = 3.3

ph-index = 3

Forward Citations = 94(Granted Patents)


Company Filing History:


Years Active: 1997-2000

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3 patents (USPTO):Explore Patents

Title: Innovations of Stanley Gross in Material Measurement

Introduction

Stanley Gross is an accomplished inventor based in Rochester, NY (US). He has made significant contributions to the field of material measurement, holding a total of 3 patents. His work focuses on innovative methods for determining the physical properties of materials, particularly their thickness profiles.

Latest Patents

One of Stanley Gross's latest patents is a "Method for measuring material thickness profiles." This invention provides a method for determining the thickness of a moving material that has at least two optical interfaces. The process involves transporting a length of material along a designated path at a constant velocity while maintaining predetermined flatness. A beam of light is directed toward the moving material, and the reflected light is collected and analyzed by an interferometer apparatus to generate an interference signal. This signal is then used to determine the thickness profile of the material.

Another notable patent is the "Associated dual interferometric measurement apparatus for determining physical properties." This invention relates to an apparatus and method for measuring various physical properties of an object, such as thickness and the group index of refraction. The apparatus includes both non-coherent and coherent light interferometers that share a variable optical path delay element. This allows for accurate thickness measurements of solids, liquids, and even multiple layers of materials.

Career Highlights

Stanley Gross has had a distinguished career at Eastman Kodak Company, where he has applied his expertise in optical measurement technologies. His innovative approaches have contributed to advancements in the field, enhancing the capabilities of material analysis.

Collaborations

Throughout his career, Stanley has collaborated with notable colleagues, including Michael Alan Marcus and David C. Wideman. These partnerships have fostered a creative environment that has led to the development of groundbreaking technologies in material measurement.

Conclusion

Stanley Gross's contributions to the field of material measurement through his innovative patents demonstrate his commitment to advancing technology. His work continues to influence the industry and inspire future innovations.

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